Telesis Logo

Phone Icon (469) 480-3366
Dallas, TX 75254
Metrology

Metrology

Tools, Systems and Instruments to Support the Nanotechnology, Thin Film, Thermal and Vacuum Markets.
Metrology Equipment for Nanoscale


HERZAN, lOGO

Sensitive, instruments require specific parts to operate properly. Herzan supplies vibration, acoustic, and EM isolation platforms to ensure your instruments operate at their best.

Herzan™
KLA Tencor, logo

KLA-Tencor manufactures the D-series D-500, D-600, P-7 and P-17 surface profilers for both development and production applications. KLA-Tencor also offers the Micro XAM 100 Optical profiler.
New this year, we offer Nanomechanical Testers including the G-200 Nanoindenter

KLA-Tencor™
Park Systems, logo

Park™ is the leading manufacturer of atomic force microscopes for use in medical, thin film, semiconductor and materials research. Park Systems instruments offer state of the art technology and software.

Park AFM™

ZETA

Zeta3D metrology systems. Non-contact optical profiler with Multi-Mode Optics are capable of measuring difficult surfaces that white light interferometers and confocal microscopes cannot match.

Zeta™

Nanomechanics Inc Logo

Nanomechanics, Inc. offers a variety of tools for mechanical properties testing in both vacuum and ambient environments. Nanoindenters are used for testing a wide variety of materials including both thin films and bulk material.  Designed for both industry and academia, our products provide accurate and precise measurements of hardness, modulus and other material properties.

NanoMechanics™

Contact us at (469) 480-3366 in Dallas, Texas, for more information about our Metrology Equipment, including Surface Profilers, Optical Profilers, AFM (Atomic Force Microscopes), and Vibration Isolation Platforms.